期刊论文详细信息
IEICE Electronics Express
A 2-stage-pipelined 16 port SRAM with 590Gbps random access bandwidth and large noise margin
Hans Jürgen Mattausch1  Koh Johguchi1  Ken-ichi Aoyama1  Yuya Mukuda1  Tetsushi Koide1 
[1] Research Center for Nanodevices and Systems, Hiroshima University
关键词: SRAM;    multi-port memory;    distributed crossbar;    multi-stage sensing;   
DOI  :  10.1587/elex.4.21
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
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【 摘 要 】

References(6)Cited-By(2)A 90nm CMOS, 64Kbit, 1.16GHz, 16 port SRAM with multi-bank architecture realizing 590Gbps random access bandwidth, 41mW power dissipation at 1GHz and 0.91mm2 (13.9µm2/bit) area consumption is reported. Compared to conventional 16 port SRAM data, area and power consumption are reduced by factors 16 and 5, respectively, while maximum clock frequency is about a factor 2 higher.

【 授权许可】

Unknown   

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