期刊论文详细信息
IEICE Electronics Express | |
A 2-stage-pipelined 16 port SRAM with 590Gbps random access bandwidth and large noise margin | |
Hans Jürgen Mattausch1  Koh Johguchi1  Ken-ichi Aoyama1  Yuya Mukuda1  Tetsushi Koide1  | |
[1] Research Center for Nanodevices and Systems, Hiroshima University | |
关键词: SRAM; multi-port memory; distributed crossbar; multi-stage sensing; | |
DOI : 10.1587/elex.4.21 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(6)Cited-By(2)A 90nm CMOS, 64Kbit, 1.16GHz, 16 port SRAM with multi-bank architecture realizing 590Gbps random access bandwidth, 41mW power dissipation at 1GHz and 0.91mm2 (13.9µm2/bit) area consumption is reported. Compared to conventional 16 port SRAM data, area and power consumption are reduced by factors 16 and 5, respectively, while maximum clock frequency is about a factor 2 higher.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300270705ZK.pdf | 1127KB | download |