期刊论文详细信息
IEICE Electronics Express
Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit
Kwang Yeob Lee2  Jin Woo Jung1  Yong Seo Koo1 
[1] Department of Electronics & Electrical Engineering, University of Dankook;Department of Computer Engineering, University of Seokyeong
关键词: current sensing;    LDO;    low drop out regulator;    ESD;   
DOI  :  10.1587/elex.10.20130516
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
PDF
【 摘 要 】

References(7)This paper proposes the Low-Dropout regulator including the “load current sensing circuit”. The load current sensing circuit senses the change of the load current and then reduces the ripple of the output voltage. The load transient response characteristic of the Low-Dropout regulator is improved by this method. And this paper uses a body driven technique to enhance the current driving capability for pass transistor. The proposed circuit is simulated by HSPICE with a 0.18μm BCD process parameter. In addition, this paper enhances the reliability of IC by equipping the P-substrate triggered SCR type ESD protection device.

【 授权许可】

Unknown   

【 预 览 】
附件列表
Files Size Format View
RO201911300261648ZK.pdf 2888KB PDF download
  文献评价指标  
  下载次数:7次 浏览次数:10次