A resistance matching based self-testable current-mode R-2R digital-to-analog converter

IEICE Electronics Express

Jun Yuan²  Masayoshi Tachibana¹ 

[1] Department of Electronic and Photopic System Engineering, Kochi University of Technology;School of Optoelectronic Engineering/Chongqing International Semiconductor School, Chongqing University of Posts and Telecommunications (CQUPT)

关键词: built-in self-test;    resistance matching;    design for testability;    digital-to-analog converter;   

DOI  :  10.1587/elex.10.20130753

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(7)This paper presents a resistance matching based self-testable current-mode R-2R Digital-to-Analog Converter (DAC). The Built-In Self-Test (BIST) circuits are employed to observe the current redistributions in the resistance matching branches converted from the R-2R network in the DAC, and then the redistributed currents are transformed to voltages to detect the R-2R network with extra Design For Testability (DFT) circuits. The circuit-level simulation of the proposed BIST system are presented to demonstrate the feasibility with fault coverage of 96% for R-2R network and 82.6% for the Operational Amplifier (OpAmp), and area overhead of approximately 6%.

【 授权许可】

Unknown