Extending resonant inelastic X-ray scattering to the extreme ultraviolet

Frontiers in Physics

Chuang, Yi-De¹  Huang, Shih-Wen¹  Hussain, Zahid¹  Ikeuchi, Kazuhiko²  Jarrige, Ignace³  Wray, L. Andrew⁴  Li, Jia⁵  Qiu, Z. Q.⁵  Ishii, Kenji⁶ 

[1] Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA;Comprehensive Research Organization for Science and Society, Ibaraki, Japan;Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA;Department of Physics, New York University, New York, NY, USA;Physics Department, University of California, Berkeley, Berkeley, CA, USA;SPring-8, Japan Atomic Energy Agency, Hyogo, Japan

关键词: Mott insulator;    Resonant inelastic X-ray scattering;    Extreme ultraviolet;    Collective excitations;    X-ray reflectivity;   

DOI  :  10.3389/fphy.2015.00032

学科分类：物理（综合）

来源: Frontiers

【 摘 要 】

In resonant inelastic X-ray scattering (RIXS), core hole resonance modes are used to enhance coupling between photons and low energy electronic degrees of freedom. Resonating with shallow core holes accessed in the extreme ultraviolet (EUV) can provide greatly improved energy resolution at standard resolving power, but has been found to often yield qualitatively different spectra than similar measurements performed with higher energy X-rays. This paper uses experimental data and multiplet-based numerical simulations for the M-edges of Co-, Ni- and Cu-based Mott insulators to review the properties that distinguish EUV RIXS from more commonly performed higher energy measurements. Key factors such as the origin of the strong EUV elastic line and advantages of EUV spectral functions over soft X-ray RIXS for identifying intrinsic excitation line shapes are discussed.

【 授权许可】

CC BY