A highly reliable butterfly PUF in SRAM-based FPGAs

IEICE Electronics Express

Xiangsheng Fang¹  Yiming Ouyang²  Zhengfeng Huang³  Xiumin Xu³  Maoxiang Yi³  Huaguo Liang³  Tianming Ni³  Cuiyun Jiang⁴ 

[1] Department of Information Project, Anhui Institute of Economic Management;School of Computer and Information, Hefei University of Technology;School of Electronic Science and Applied Physics, Hefei University of Technology;School of Mathematics, Hefei University of Technology

关键词: physically unclonable function (PUF);    SRAM-based FPGAs;    delay difference test;    selective mapping;    highly reliable;   

DOI  :  10.1587/elex.14.20170551

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

This paper presents a butterfly physically unclonable function (PUF) implementation in SRAM-based field programmable gate arrays (FPGAs). To avoid output instability, we propose a delay difference test to identify reliable slices (mapped to which butterfly PUF cells are highly reliable) and then PUF reliability is significantly improved by selective mapping PUF cells to reliable slices, which is validated in experimental results.

【 授权许可】

CC BY