A transient pulse dually filterable and online self-recoverable latch

IEICE Electronics Express

Yingchun Lu¹  Aibin Yan²  Zhengfeng Huang³  Huaguo Liang³ 

[1] Applied Physics, Hefei University of Technology;School of Computer Science and Technology, Anhui University;School of Electronic Science &

关键词: single event transient;    single event upset;    latch design;   

DOI  :  10.1587/elex.13.20160911

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

This paper presents a transient Pulse Dually Filterable and online Self-Recoverable (referred to as PDFSR) latch. Based on soft error masking property of C-element and using built-in delayed paths combined with a Schmitt inverter, a single event transient (SET) pulse could be dually filtered. Meanwhile, mutually feeding back mechanism of multiple C-elements was constructed to retain data, which makes the latch self-recoverable from a single event upset (SEU). Simulation results have demonstrated the SET filtering ability and SEU resilience at the cost of only 2.0% area-power-delay-width product increase on average, compared with the similar latches.

【 授权许可】

CC BY