Functional test data generation for Simulink-like models

Brazilian Computer Society. Journal

Marcio Eduardo Delamaro¹  Rodrigo Fraxino Araujo²  Jose Carlos Maldonado⁷ 

[1] ãInstituto de ComputaçLinux Technology Center, IBM, São Carlos, Brazil;o Paulo, Brazil;o Paulo, São e Matemática Computacional, Universidade de Sã

关键词: Embedded system;    Pairwise testing;    Simulink;    Scicos;   

DOI  :  10.1007/s13173-013-0104-z

学科分类：农业科学（综合）

来源: Springer U K

【 摘 要 】

Embedded systems are increasingly present in many electronic devices and is often related to critical applications. Therefore, the need for a well planned and executed testing procedure is even higher. We intend to contribute in this area by presenting an experimental evaluation of the pairwise combinatorial approach as a technique for test data generation applied specifically to Simulink-like models. In particular, we have applied our strategy to the generated source code of several models. Furthermore, a testing tool was developed to assist in the test data generation process. We show that there is no statistical significant advantages of the proposed approach over random generation of test data, but when used together they yield better results. The feasibility of the experimental results indicate that efforts can be employed in order to obtain a testing strategy integrated within a testing environment.

【 授权许可】

CC BY