Yes, one can obtain better quality structures from routine X-ray data collection

IUCrJ

Wo?niak, K.¹  Sanjuan-Szklarz, W.F.¹  Hoser, A.A.¹  Madsen, A.Ø.²  Gutmann, M.³ 

[1] Biological and Chemical Research Centre, Chemistry Department, University of Warsaw, ?wirki i Wigury 101, 02-089 Warszawa, Poland;Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100 Copenhagen, Denmark;Rutherford Appleton Laboratory, ISIS Facility, Chilton, Didcot, Oxfordshire OX11 OQX, UK

关键词: X-RAY DIFFRACTION RESULTS;    PRECISION;    INDEPENDENT ATOM MODEL;    TRANSFERABLE ASPHERICAL ATOM MODEL;    GEOMETRIC PARAMETERS;    TLS ANALYSIS;   

DOI  :  10.1107/S2052252515020941

学科分类：数学（综合）

来源: International Union of Crystallography

【 授权许可】

CC BY