Bulletin of Materials Science | |
Bipolar resistive switching behaviours in ZnMn2O4 film deposited on p+-Si substrate by chemical solution deposition | |
关键词: ZnMn2O4; bipolar; resistive switching; chemical solution deposition.; | |
学科分类:材料工程 | |
来源: Indian Academy of Sciences | |
【 摘 要 】
ZnMn2O4 active layer for resistance random access memory (RRAM) was deposited on p+-Si substrate by chemical solution deposition. The bipolar resistive switching behaviours of the Ag/ZnMn2O4/p+-Si capacitor are investigated. The bipolar resistive switching is reproducible and shows high ON/OFF ratio of > 102 and long retention times of > 105 s. The conduction mechanism of the Ag/ZnMn2O4/p+-Si capacitor in the low-resistance state (LRS) is ohmic conduction, whereas that of the device in high-resistance state (HRS) successively undergoes Ohm’s law, trap-filled-limited and Child’s law conduction procedure at room temperature.
【 授权许可】
CC BY
【 预 览 】
Files | Size | Format | View |
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RO201902182285074ZK.pdf | 970KB | download |