期刊论文详细信息
| Active and Passive Electronic Components | |
| Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors | |
| K. Raïs2 R. Rmaily2 E. Bendada1 Y. Amhouche2 A. El Abbassi2 | |
| [1] Laboratoire de la Microélectronique et de l'instrumentation, Faculté des Sciences et Techniques, B.P. 509 Errachidia, , Morocco;Laboratoire de Caractérisation des Composants à Semi-conducteurs, Université Chouaib, Doukkali B.P. 20, EL Jadida, Morocco, ucd.ac.ma | |
| 关键词: Series resistance; Effective mobility; Surface roughness; MOS Transistor; | |
| Others : 1369705 DOI : 10.1155/2001/75780 |
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| received in 2001-02-05, accepted in 2001-03-19, 发布年份 2001 | |
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【 授权许可】
Copyright © 2001 Hindawi Publishing Corporation 2001
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