High Repair Efficiency BIRA Algorithm with a LineFault Scheme

ETRI Journal

关键词: repair efficiency;    memory yield;    Built-in redundancy analysis (BIRA);   

Others  :  1185931
DOI  :  10.4218/etrij.10.0210.0097

【 摘 要 】

With the rapid increase occurring in both the capacity and density of memory products, test and repair issues have become highly challenging. Memory repair is an effective and essential methodology for improving memory yield. An SoC utilizes built-in redundancy analysis (BIRA) with built-in self-test for improving memory yield and reliability. This letter proposes a new heuristic algorithm and new hardware architecture for the BIRA scheme. Experimental results indicate that the proposed algorithm shows near-optimal repair efficiency in combination with low area and time overheads.

   

【 参考文献 】

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