A Novel BIRA Method with High Repair Efficiency and Small Hardware Overhead

ETRI Journal

关键词: repair rate;    yield;    embedded memory;    Built-in redundancy analysis (BIRA);   

Others  :  1185823
DOI  :  10.4218/etrij.09.0209.0024

【 摘 要 】

Built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.

   

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