Simple Near-Field Optical Recording Using Bent Cantilever Probes

ETRI Journal

关键词: photochromic;    bent cantilever probe;    high density;    data storage;    Near-field;   

Others  :  1184572
DOI  :  10.4218/etrij.02.0102.0304

【 摘 要 】

This paper describes our high-density near-field optical recording using bent cantilever fiber probes installed in an atomic force microscope. We conducted a near-field reading of nano-scale hole patterns with a 100 nm spatial resolution and a 25 μm/s sca

   

【 参考文献 】

• [1]E. Betzig, J.K. Trautman, R. Wolfe, E.M. Gyorgy, P.L. Finn, M.H. Kryder, and C.H. Chang, "Near-Field Magneto-Optic and High Density Data Storage," Appl. Phys. Lett., vol. 61, 1992, pp. 142-144.
• [2]B.D. Terris, H.J. Mamin, and D. Rugar, "Near-Field Optical Data Storage," Appl. Phys. Lett., vol. 68, 1996, pp. 141-143.
• [3]J. Kim, J.T. Boyd, H.E. Jackson, and K.D. Choquette, "Near-Field Spectroscopy of Selectively Oxidized Vertical Cavity Surface emitting Lasers," Appl. Phys. Lett., vol. 76, no. 5, 2000, pp. 526-528.
• [4]W.C. Liu, C.Y. Wen, K.H. Chen, W.C. Lin, D.P. Tsai, "Near-Field Images of the AgO/sub x/-type Super-Resolution Near-Field Structure," Appl. Phys. Lett., vol. 78, no. 6, 2001, pp. 685-687.
• [5]S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, and S. Kammer, "Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode," Jpn. J. Appl. Phys., vol. 35, 1996, pp. 443-447.
• [6]M.R. Kim, J.H. Park, and W. Jhe, "Near-Filed Optical Recording by Reflection-Mode Near-Field Scanning Optical Microscope: Submicron-Sized Marks and their Thermodynamic Stability," Jpn. J. Appl. Phys., vol. 39, 2000, pp. 984-985.
• [7]M. Hamano and M. Irie, "Rewritable Near-Field Optical Recording on Photochromic Thin Films," Jpn. J. Appl. Phys., vol. 35, 1996, pp. 1764-1767.
• [8]M. Irie, H.I. Ishida, and T. Tsujioka, "Rewritable Near-Field Optical Recording on Photochromic Perinaphthothioindigo Thin Films: Readout by Fluorescence," Jpn. J. Appl. Phys., vol. 38, 1999, pp. 6114-6117.
• [9]M. Irie, "Photochromism: Memories and Switches-Introduction," Chem. Rev., vol. 100, 2000, pp. 1685-1716.
• [10]K. Lieberman, A. Lewis, G. Fish, S. Shalom, T.M. Jovin, A. Schaper, and S.R. Cohen, "Multifunctional, Micropipette Based Force Cantilevers for Scanned Probe Microscopy," Appl. Phys. Lett., vol. 65, 1994, pp. 648-650.
• [11]K. Nakajima, H. Muramastu, N. Chiba, T. Ataka, and M. Fujihira, "Optical Processing by Scanning Near-Field Optical/Atomic Force Microscopy," Thin Solid films, vol. 273, 1996, pp. 327-330.
• [12]J. Kim, K.B. Song, and K.H. Park, "Near-Field Optical Readout Combined with Atomic Force Probe Writing," to be published in Jpn. J. Appl. Phys., vol. 41, 2002, pp. 1903-1904.
• [13]W. Fann, "Simple Transmission Mode Near-Field Optical Microscope," Rev. Sci. Instum. vol. 66, 1995, pp. 271-272.
• [14]F. Issiki, K. Ito, K. Etoh, and S. Hosaka, "1.5-Mbit/s Direct Readout of Line-and-Space Patterns Using a Scanning Near-Field Optical Microscopy Probe Slider with Air-bearing Control," Appl. Phys. Lett., vol. 76, 2000, pp. 804-806.
• [15]T. Iida and M. Katsumura, "Progress of High Density Mastering Using Electron Beam Recorder," ISOM 2001 Technical digest, 2001, pp. 66-67.