Structural Electrical and Detection Properties of Copper Oxide Based on Optoelectronic Device

International Conference on Materials Engineering and Science

Hassan, Mariam M.^1,2 ; Fakhri, Makram A.^1 ; Adnan, Salah Aldeen^1

Laser and Optoelectronic Department, University of Technology, Baghdad

10066, Iraq^1

Ministry of Health, Baghdad, Iraq^2

关键词: Copper oxide thin films;    Detector parameters;    Different substrates;    Laser energies;    Nanostructure thin films;    Polycrystalline;    Reactive pulsed laser deposition;    Silicon substrates;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/454/1/012172/pdf
DOI  :  10.1088/1757-899X/454/1/012172

来源: IOP

【 摘 要 】

In this work, the effect of different substrate temperatures on the electrical and detection properties of Cu0z copper oxide thin film has been carried out using Reactive Pulsed Laser Deposition technique (RPLD). λ = 1046 nm Q-switch Nd-YAG laser with (900 mj) laser energy's has been used to ablated pure copper target and deposited on the Silicon substrates. The X-ray diffraction in sour the formation of polycrystalline Cu2O nanostructure thin film.