Investigation of opal nanostructures using scanning probe microscopy

Scanning Probe Microscopy 2018

Syritskii, A.B.^1 ; Panfilova, E.V.^2

Department of Metrology and Interchangeability, Moscow State Technical University Bauman, Moscow

105005, Russia^1

Department of Electronic Technologies in Mechanical Engineering, Moscow State Technical University Bauman, Moscow

105005, Russia^2

关键词: Film structure;    Gold structures;    Layered Structures;    Multilayer structures;    Particle arrays;    Research results;    Sensitive elements;    Tunnel currents;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/443/1/012035/pdf
DOI  :  10.1088/1757-899X/443/1/012035

来源: IOP

【 摘 要 】

The paper presents the research results on the creation of multilayer structures based on opal films using the methods of atomic force microscopy, tunnelling microscopy, and current spectroscopy. It is found that tunnelling microscopy methods are applicable for studying chromium-opal-gold-carbon layered structures. Surface images and current-voltage characteristics of each layer are shown. It is shown that the formation of film structures on the surface of opal matrix starts with "islands" on tops of silica spheres. It is found that the deposition of carbon films on the surface of the chrome-opal-gold structure leads to increase in tunnel currents in the probe-sample gap. The presented results may be used for the formation of a variety of layered structures and particle arrays on the surface of opal matrix, e.g., photonic devices, sensitive elements, and emission devices.