Polished sample preparing and backscattered electron imaging and of fly ash-cement paste

2017 International Symposium on Application of Materials Science and Energy Materials

材料科学;能源学

Feng, Shuxia^1 ; Li, Yanqi^1

School of Architectural Engineering, Shandong Yingcai University, Jinan, China^1

关键词: Accelerating voltages;    Backscattered electron images;    Backscattered electron imaging;    Fly ash cement paste;    Grey-level distributions;    Polished surfaces;    Sample preparation;    Test accuracy;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/322/2/022060/pdf
DOI  :  10.1088/1757-899X/322/2/022060

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

In recent decades, the technology of backscattered electron imaging and image analysis was applied in more and more study of mixed cement paste because of its special advantages. Test accuracy of this technology is affected by polished sample preparation and image acquisition. In our work, effects of two factors in polished sample preparing and backscattered electron imaging were investigated. The results showed that increasing smoothing pressure could improve the flatness of polished surface and then help to eliminate interference of morphology on grey level distribution of backscattered electron images; increasing accelerating voltage was beneficial to increase gray difference among different phases in backscattered electron images.