Application of an improved threshold segmentation method in SEM material analysis

2017 International Symposium on Application of Materials Science and Energy Materials

材料科学;能源学

Li, Denghui^1 ; Wang, Yanhong^2

Institute of Information Technology, Guilin University of Electronic Technology, Guangxi Key Lab of Wireless Wideband Communication and Signal Processing, Guilin, China^1

Key Laboratory of Cognitive Radio and Information Processing, Ministry of Education, Guilin University of Electronic Technology, GUET, Guilin, China^2

关键词: Complex image;    Material analysis;    Method of images;    Multi-threshold segmentation;    Threshold analysis;    Threshold methods;    Threshold segmentation;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/322/2/022057/pdf
DOI  :  10.1088/1757-899X/322/2/022057

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Threshold analysis is a common method of image analysis. It is difficult to separate the target from the background with only one threshold method for more complex images. An improved multi threshold segmentation algorithm is proposed based on the characteristics of the SEM material itself. The all completed experimental results show that the algorithm is effective.