Study on the Ag Nanowire/PDMS Pressure Sensors with Three-Layer and Back-to-Back Structures

5th Annual International Conference on Material Science and Environmental Engineering

材料科学;生态环境科学

Wu, Jianhao^1 ; Lan, Qiuming^1 ; Yang, Weijia^1 ; He, Xin^1 ; Yue, Yunting^1 ; Jiang, Jiayi^1 ; Jiang, Tinghui^1

School of Applied Physics and Materials, Wuyi University, Jiangmen

529020, China^1

关键词: Ag nanowires;    Back-structure;    Bending angle;    Capacitance values;    Paper clips;    Response linearity;    Response sensitivity;    Three-layer;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/301/1/012007/pdf
DOI  :  10.1088/1757-899X/301/1/012007

来源: IOP

【 摘 要 】

Ag nanowire (NW)/polydimethylsiloxane (PDMS) pressure sensors with the three-layer and back-to-back structures were fabricated by a coating-peeling method. The bending and pressing responses of the sensors were comparably investigated. The results reveal that two kinds of pressure sensors show similar response linearity in the bending test with a bending angle of 0-180°. However, the response sensitivity of the three-layer structured pressure sensor is superior to that of the back-to-back structural one, which exhibits that the relationship between the capacitance value (Y) and the bending angle (X) is: Y = 0.01244X + 2.9763. On the contrary, in the pressing test, the response sensitivity of the back-to-back structural sensor is better than that of the three-layer structural one. The relationship between capacitance value (Y) and the number of paper clips (pressure, X2) is Y = 0.09241X2+ 88.03597.