The effect of material matching on the stress-induced power degradation for light-redirecting-ribbon-based silicon photovoltaic modules

2nd International Conference on New Material and Chemical Industry

材料科学;化学工业

Gou, X.F.^1,2 ; Zhuang, H.^2 ; Zhu, J.^2 ; Li, X.Y.^1

Beijing University of Technology, Beijing

100124, China^1

CECEP, Solar Energy Technology Co. Ltd, Zhenjiang

212132, China^2

关键词: Additional stress;    Crystalline silicon modules;    Encapsulants;    Power degradation;    Power-losses;    Silicon photovoltaic modules;    Stress-induced;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/292/1/012045/pdf
DOI  :  10.1088/1757-899X/292/1/012045

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Light redirecting ribbons (LRR) have recently been adopted in crystalline silicon modules in PV industry. The introduction of this LRR may bring additional stress at the boundary of the busbar/wafer contact, which may probably lead to higher power loss after aging. The thermal cycle and electroluminescence (EL) test are employed in this work to investigate this stress-induced power degradation for LRR-based crystalline silicon modules. The obtained results demonstrate that with increase in the thickness of the EVA encapsulant or the decrease in the thickness of the LRR, the power degradation induced by stress can be effectively diminished.