Scanning probe microscopy in mineralogical studies: about origin of the observed roughness of natural silica-rich glasses

Scanning Probe Microscopy 2017

Golubev, Ye.A.^1 ; Isaenko, S.I.^1

Institute of Geology of Komi SC, Uralian Branch of RAS, Syktyvkar, Russia^1

关键词: Chemical compositions;    Chemical features;    Different origins;    Infrared and Raman spectroscopy;    Nano-scale heterogeneities;    Natural glass;    Natural silica;    X-ray microanalysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/256/1/012019/pdf
DOI  :  10.1088/1757-899X/256/1/012019

来源: IOP

【 摘 要 】

We have studied different mineralogical objects: natural glasses of impact (tektites, impactites) and volcanic (obsidians) origin, using atomic force microscopy, X-ray microanalysis, infrared and Raman spectroscopy. The spectroscopy showed the difference in the structure and chemical composition of the glasses of different origin. The analysis of the dependence of nanoscale heterogeneity of the glasses, revealed by the atomic force microscopy, on their structural and chemical features was carried out.