Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes

Scanning Probe Microscopy 2017

Sokolov, D.V.^1 ; Davletkildeev, N.A.^1,2 ; Bolotov, V.V.^1 ; Lobov, I.A.^1

Omsk Scientific Center, SB RAS, Omsk

644024, Russia^1

F.M. Dostoevsky Omsk State University, Omsk

644077, Russia^2

关键词: Electrical parameter;    Electrical resistances;    Free carriers;    Scanning probe microscopy techniques;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/256/1/012018/pdf
DOI  :  10.1088/1757-899X/256/1/012018

来源: IOP

【 摘 要 】

Using two techniques of scanning probe microscopy, the electrical properties (work function, Fermi level position, free carriers' concentration, electrical resistance, conductivity, and carriers' mobility) of individual multiwalled carbon nanotubes were evaluated.