Waveguide sensor with metamaterial structure for determination of dielectric properties

5th ModTech International Conference - Modern Technologies in Industrial Engineering

Steigmann, R.^1,2 ; Savin, A.^1 ; Isteniková, K.^3 ; Faktorová, D.^4 ; Fabo, P.^5

National Institute of RandD for Technical Physics, Iasi, Romania^1

Alexandru Ioan Cuza University, Faculty of Physics, Iasi, Romania^2

Continental Matador Rubber, Ltd., Puchov, Slovakia^3

University of ilina, Faculty of Electrical Engineering, ilina, Slovakia^4

University of ilina, Research Centre, ilina, Slovakia^5

关键词: Complex permittivity;    Metamaterial structures;    Non-destructive measurement;    Optimal design;    Resonance frequencies;    Sensing property;    Structure property;    Waveguide sensors;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/227/1/012123/pdf
DOI  :  10.1088/1757-899X/227/1/012123

来源: IOP

【 摘 要 】

Microwave sensor (MWS) compared with classical sensor, offers many advantage such as rapid and nondestructive measurement. At microwave (MW) frequencies, dielectric properties of materials depend on frequency, moisture content, bulk density and temperature. MW waveguide sensors can measure properties of materials based on MW interaction with matter, and provide information about dielectric properties of investigated dielectric material, characterized with complex permittivity. The paper presents a new approach for determination of the dielectric properties of dielectric material by embedding a metamaterial (MM) structure over the aperture of waveguide sensor in order to increase the sensing properties of classical waveguide sensor. The optimal design of MM structure for waveguide sensor tuning in MW X-band is obtained. In this new approach the MM function in two ways: like a tool for increasing the sensibility of classical waveguide sensor and the tool sensitive to the dielectric properties of investigated material through the adjusted resonance frequency of designed MM units. The numerical simulation of 2D MM structure properties and experimental results for dielectric properties of dielectric materials are carried out.