Conversion of elastic waves as a result of diffraction in anisotropic layer

Winter School on Continuous Media Mechanics

Belyayev, Y.N.^1

Syktyvkar State University, Oktyabrskii ave. 55, Syktyvkar

167001, Russia^1

关键词: Anisotropic layered medium;    Anisotropic layers;    Crystalline silicons;    Eigenvalue problem;    Elastic wave scattering;    Longitudinal waves;    Polynomial approach;    Truncation errors;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/208/1/012003/pdf
DOI  :  10.1088/1757-899X/208/1/012003

来源: IOP

【 摘 要 】

The transfer matrix method for the theory of elastic wave scattering in anisotropic layered medium is developed. The cases of the six-beam diffraction are considered. The method of the transfer matrix exp(Wz) computation is based on the use of polynomials of principal minors in combination with scaling of matrix W. This method, in contrast to the Lagrange-Sylvester and others known polynomial approaches does not require solution of eigenvalue problem. Evaluations of the scaling parameter and relative truncation error of the method are made. Some features of the conversions of shear waves and longitudinal wave are demonstrated by calculations of the diffraction on a crystalline silicon layer. It is shown that the conversion SH wave into SV waves and SV wave into SH waves are equivalent.