Crystal Structure Characterization of Thin Layer Zinc Oxide

3rd International Conference on Functional Materials Science 2016

Doyan, Aris^1 ; Susilawati^1 ; Fitri, Siti Azizatul^1 ; Ahzan, Sukainil^2

Post Graduate of Mataram University, Mataram, Indonesia^1

Physcish Education Department, FPMIPA IKIP Mataram, Mataram, Indonesia^2

关键词: Crystal grain size;    Deposition temperatures;    Glass substrates;    Oxide deposition;    Sol concentration;    Structure characterization;    Temperature deposition;    Wavelength ranges;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/196/1/012004/pdf
DOI  :  10.1088/1757-899X/196/1/012004

来源: IOP

【 摘 要 】

In this research the characterization of the crystal structure of a thin layer of ZnO (zinc oxide) were synthesized by sol - gel method and spin coating deposited on a glass substrate. The samples were divided into three sol concentrations of 0.1, 0.3, 0.5 Molar and two deposition temperature is 350 °C, and 550 °C. UV-Vis. spectrophotometer results showed that in the spectrum of visible light (wavelength range 300-800 nm) has a transmittance value of which increases with increasing concentration and temperature deposition of zinc oxide, otherwise the value of the absorption and the band gap energy decreases with the addition of concentration and deposition temperature. The transmittances value of the highest and lowest absorption was 93.5% and 0.03 is at a concentration of 0.1 M and zinc oxide deposition temperature of 550 °C, with a value of band gap energy of 2.98 eV. The XRD results showed that the zinc oxide crystal orientation in the field of 013 with a crystal grain size 14.4472 nm. SEM results showed the surface morphology of zinc oxide such as rod-like.