Statistical Degradation Models for Reliability Analysis in Non-Destructive Testing

5th International Conference: Modern Technologies For Non-Destructive Testing

材料科学;物理学

Chetvertakova, E.S.^1 ; Chimitova, E.V.^1

Novosibirsk State Technical University, Novosibirsk, Russia^1

关键词: Degradation process;    Failure Probability;    Measuring frequency;    Non destructive testing;    Reliability estimates;    Reliability estimation;    Reliability functions;    Simulation technique;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/189/1/012017/pdf
DOI  :  10.1088/1757-899X/189/1/012017

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

In this paper, we consider the application of the statistical degradation models for reliability analysis in non-destructive testing. Such models enable to estimate the reliability function (the dependence of non-failure probability on time) for the fixed critical level using the information of the degradation paths of tested items. The most widely used models are the gamma and Wiener degradation models, in which the gamma or normal distributions are assumed as the distribution of degradation increments, respectively. Using the computer simulation technique, we have analysed the accuracy of the reliability estimates, obtained for considered models. The number of increments can be enlarged by increasing the sample size (the number of tested items) or by increasing the frequency of measuring degradation. It has been shown, that the sample size has a greater influence on the accuracy of the reliability estimates in comparison with the measuring frequency. Moreover, it has been shown that another important factor, influencing the accuracy of reliability estimation, is the duration of observing degradation process.