A deeper insight into (Lu,Y)AG:Pr scintillator crystals

2016 International Conference on Defects in Insulating Materials

Drozdowski, W.^1 ; Wojtowicz, A.J.^1 ; Brylew, K.^1 ; Lachmaski, W.^1 ; Talik, E.^2 ; Szubka, M.^2 ; Kusz, J.^2 ; Guzik, A.^2 ; Balin, K.^3 ; Kisielewski, J.^4 ; wirkowicz, M.^4 ; Pajaczkowska, A.^4

Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University, Grudziadzka 5, Torun

87-100, Poland^1

Institute of Physics, University of Silesia, Uniwersytecka 4, Katowice

40-007, Poland^2

Silesian Center for Education and Interdisciplinary Research, University of Silesia, 75 Pulku Piechoty 1A, Chorzow

41-500, Poland^3

Institute of Electronic Materials Technology, Wolczynska 133, Warsaw

01-919, Poland^4

关键词: Double-beam;    Magnetic susceptibility measurements;    Scintillator crystals;    Time of flight secondary ion mass spectrometry;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/169/1/012010/pdf
DOI  :  10.1088/1757-899X/169/1/012010

来源: IOP

【 摘 要 】

Interior of Czochralski-grown (Lu,Y)AG:Pr crystals has been examined by means of several techniques, such as X-Ray Photoelectron Spectroscopy, X-Ray Diffraction, Time-of-Flight Secondary Ion Mass Spectrometry, and magnetic susceptibility measurements. Additionally, their luminescence has been monitored at various combinations of a double-beam (X-ray/IR) excitation.