Effect of annealing temperature on structural and Raman spectroscopy analysis of nanostructured CdS thin films

International Conference on Advances in Materials and Manufacturing Applications 2016

Prasad, M. Venkata Veera^1 ; Thyagarajan, K.^2 ; Kumar, B. Rajesh^3

Department of Physics, JNTU Anantapur, Ananthapuramu

515002, India^1

Department of Physics, JNTUA College of Engineering, Pulivendula

516 390, India^2

Department of Physics, GIT, GITAM University, Visakhapatnam

530 045, India^3

关键词: Annealing temperatures;    Diffraction peaks;    Effect of annealing;    Field emission scanning electron microscopy;    Glass substrates;    Optical phonon modes;    Preferential orientation;    Sol-gel spin coating method;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/149/1/012051/pdf
DOI  :  10.1088/1757-899X/149/1/012051

来源: IOP

【 摘 要 】

Nanocrystalline CdS thin films were deposited on glass substrates using the sol-gel spin coating method. The structural properties and surface morphology of the CdS thin films were characterized by X-ray diffraction (XRD), Field Emission Scanning Electron Microscopy (FESEM) and Atomic force microscopy (AFM). XRD studies revealed that all the films exhibit cubic structure with a (1 1 1) preferential orientation. The diffraction peak (1 1 1) shifts towards higher 20 value with increasing annealing temperature from 150oC to 350oC. The Raman spectra shows the intense and broad peaks at ∼302 and ∼603.5cm-1which are assigned to fundamental optical phonon mode (LO) and first over tone mode (2LO) of CdS.