Studying radiation hardness of a cadmium tungstate crystal based radiation detector

8th International Scientific Conference "Issues of Physics and Technology in Science, Industry and Medicine"

物理学;工业技术;医药卫生

Shtein, M.M.^1 ; Smekalin, L.F.^1 ; Stepanov, S.A.^1 ; Zatonov, I.A.^1 ; Tkacheva, T.V.^2 ; Usachev, E.Yu.^2

National Research Tomsk Polytechnic University, Lenin Ave. 30, Tomsk

634050, Russia^1

Moscow Technological University (MIREA), Vernadskogo Ave. 78, Moscow

119454, Russia^2

关键词: Cadmium tungstate;    Comprehensive analysis;    Experimental facilities;    Inspection system;    Light transmission factor;    Non destructive testing;    Radiation hardness;    Structural component;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/135/1/012042/pdf
DOI  :  10.1088/1757-899X/135/1/012042

来源: IOP

【 摘 要 】

The given article considers radiation hardness of an X-ray detector used in production of non-destructive testing instruments and inspection systems. In the course of research, experiments were carried out to estimate radiation hardness of a detector based on cadmium tungstate crystal and its structural components individually. The article describes a layout of an experimental facility that was used for measurements of radiation hardness. The radiation dose dependence of the photodiode current is presented, when it is excited by a light flux of a scintillator or by an external light source. Experiments were carried out to estimate radiation hardness of two types of optical glue used in detector production; they are based on silicon rubber and epoxy. With the help of a spectrophotometer and cobalt gun, each of the glue samples was measured for a relative light transmission factor with different wavelengths, depending on the radiation dose. The obtained data are presented in a comprehensive analysis of the results. It was determined, which of the glue samples is most suitable for production of detectors working under exposure to strong radiation.