Radiation enhanced diffusion processes in UO2 and (U,Pu)O2

10th International School-Conference on Materials for Extreme Environment: Development, Production and Application

Smirnov, E.^1 ; Elmanov, G.^1

National Research Nuclear University MEPhI, Moscow Engineering Physics Institute), Kashirskoe highway, 31, Moscow

115409, Russia^1

关键词: Cationic vacancy;    Diffusion mechanisms;    Diffusion process;    Fluorite structure;    Frenkel defects;    Migration mechanisms;    Radiation-enhanced diffusion;    Temperature dependence;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/130/1/012063/pdf
DOI  :  10.1088/1757-899X/130/1/012063

来源: IOP

【 摘 要 】

The diffusion mechanisms and migration characteristics of point defects in the fluorite structures of UO2and (U, Pu) O2were analyzed. The possibility of complex migration mechanisms of anionic and cationic vacancy and interstitial Frenkel defects depending on the stoichiometry of materials was shown.The statistical analysis of published data on the radiation-enhanced diffusion (RED) characteristics of metal atoms in UO2and (U, Pu)O2for temperatures 1303-1673 K was carried out. An approximate temperature dependence of RED coefficient was obtained. Within the framework of understanding of the mechanisms of diffusion processes in fluorite structure, the approximate temperature dependence of the RED coefficient of oxygen for UO2and (U, Pu)O2was proposed.