会议论文详细信息
19th International Scientific Conference Reshetnev Readings 2015 | |
Plasma chemical silicon etching process* | |
Rudenko, K.V.^1 ; Miakonkih, A.V.^1 ; Rogojin, A.E.^1 ; Bogdanov, S.V.^2 ; Sidorov, V.G.^2 ; Kovalev, I.V.^2 | |
Institute of Physics and Technology, Russian Academy of Sciences, Moscow, Russia^1 | |
Reshetnev Siberian State Aerospace University, Krasnoyarsk, Russia^2 | |
关键词: Cryogenic plasma; Deep holes; High aspect ratio; Silicon etching; Silicon layer; | |
Others : https://iopscience.iop.org/article/10.1088/1757-899X/122/1/012028/pdf DOI : 10.1088/1757-899X/122/1/012028 |
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来源: IOP | |
【 摘 要 】
The cryogenic plasma chemical silicon etching process is developed, able to form the structured silicon layer with system of deep holes with high aspect ratio.
【 预 览 】
Files | Size | Format | View |
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Plasma chemical silicon etching process* | 907KB | download |