Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals

International Scientific Conference on "Radiation-Thermal Effects and Processes in Inorganic Materials"

材料科学;物理学

Chernyavskii, A.V.^1 ; Kaz, M.S.^2

National Research Tomsk Polytechnic University, Tomsk, Russia^1

National Research Tomsk State University, Tomsk, Russia^2

关键词: Accurate estimation;    Alkali-halide crystals;    Ambient atmosphere;    Diffusion profiles;    Isothermal diffusion;    Magnesium fluoride;    Potassium bromide;    Secondary ion mass spectrometers;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/81/1/012088/pdf
DOI  :  10.1088/1757-899X/81/1/012088

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen.