Positive ion mass spectrometry for fragmentation of anthracene by low energy electron impact

30th International Conference on Photonic, Electronic, and Atomic Collisions

Dunne, M.^1 ; Gradziel, M.L.^1 ; Van Der Burgt, P.J.M.^1

Department of Experimental Physics, National University of Ireland Maynooth, Co. Kildare, Maynooth, Ireland^1

关键词: Anthracene molecules;    Appearance energy;    Electron impact;    Ion mass spectrometry;    Low energy electron impacts;    Mass spectra;    Positively charged;    Time-of-flight mass spectrometers;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/7/062013/pdf
DOI  :  10.1088/1742-6596/875/7/062013

来源: IOP

【 摘 要 】

Synopsis. We have studied the fragmentation of anthracene molecules induced by low energy electron impact. A reflectron time-of-flight mass spectrometer has been used to mass resolve and detect positively charged fragments. Using computer controlled data acquisition, mass spectra have been measured as a function of electron impact from 5 to 100 eV. The mass spectra show clear indications of double and triple ionization. Ion yield curves and appearance energies for most of the positive ions have been extracted from the data.