Performance of the HERMES beamline at the carbon K-edge

X-Ray Microscopy Conference 2016

Swaraj, S.^1 ; Belkhou, R.^1 ; Stanescu, S.^1 ; Rioult, M.^1 ; Besson, A.^1 ; Hitchcock, A.P.^2

Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin-BP 48, Gif-sur-Yvette Cedex

F-91192, France^1

McMaster University, Hamilton

ON

L8S 4M1, Canada^2

关键词: Absorption edges;    Beamline optics;    Carbon contamination;    Carbon K-edge;    Organic materials;    Spectromicroscopy;    Test samples;    X ray irradiation;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012046/pdf
DOI  :  10.1088/1742-6596/849/1/012046

来源: IOP

【 摘 要 】

Contamination of soft X-rays beamline optics due to carbon cracking and deposition under X- ray irradiation is especially critical for spectromicroscopy operations near the carbon K-absorption edge from organic materials, polymers and nanoparticles. In this paper we present the strategy and procedure followed on the HERMES beamline (Synchrotron SOLEIL) to minimize carbon contamination of the beamline optics. Measurements on a complex organic test sample are reported to demonstrate the performance of the beamline at the carbon K-edge in imaging, spectroscopy and spectromicroscopy modes.