Near-Field Diffraction Imaging from Multiple Detection Planes

X-Ray Microscopy Conference 2016

Loetgering, L.^1 ; Golembusch, M.^1 ; Hammoud, R.^1 ; Wilhein, T.^1

Institute for X-Optics, RheinAhrCampus Remagen, Joseph-Rovan-Allee 2, Remagen

53424, Germany^1

关键词: Coherent diffraction imaging;    Diffraction imaging;    Iterative phase retrieval algorithm;    Multiple constraint;    Multiple detection;    Near-field diffraction;    Polychromatic radiation;    Priori knowledge;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012025/pdf
DOI  :  10.1088/1742-6596/849/1/012025

来源: IOP

【 摘 要 】

We present diffraction imaging results obtained from multiple near-field diffraction constraints. An iterative phase retrieval algorithm was implemented that uses data redundancy achieved by measuring near-field diffraction intensities at various sample-detector distances. The procedure allows for reconstructing the exit surface wave of a sample within a multiple constraint satisfaction framework neither making use of a priori knowledge as enforced in coherent diffraction imaging (CDI) nor exact scanning grid knowledge as required in ptychography. We also investigate the potential of the presented technique to deal with polychromatic radiation as important for potential application in diffraction imaging by means of tabletop EUV and X-ray sources.