Magnetic domain structure investigation of Bi: YIG-thin films by combination of AFM and cantilever-based aperture SNOM

3rd International School and Conference on Optoelectronics, Photonics, Engineering and Nanostructures (Saint Petersburg OPEN 2016)

Vysokikh, Yu E.^1 ; Shelaev, A.V.^2 ; Prokopov, A.R.^3 ; Shevyakov, V.I.^1 ; Krasnoborodko, S. Yu^1,2

National Research University of Electronic Technology, Zelenograd, Moscow

124498, Russia^1

NT-MDT Co, Zelenograd, Moscow

124482, Russia^2

V.I. Vernadsky Crimean Federal University, Simferopol

295007, Russia^3

关键词: Domain orientation;    Domain structure;    High-resolution magnetic domain;    Hollow pyramids;    Linearly polarized lasers;    Magnetic probes;    Substituted ferrites;    Transmitted light;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/741/1/012190/pdf
DOI  :  10.1088/1742-6596/741/1/012190

来源: IOP

【 摘 要 】

We present the results of magnetic domain structure investigation by combination of atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). Special hollow-pyramid AFM cantilevers with aperture was used. This combination allows us use same probe for both topography and domain structure visualization of Bi -substituted ferrite garnet films of micro- and nano-meter thickness. Samples were excited through aperture by tightly focused linearly polarized laser beam. Magneto-optical effect rotates polarization of transmitted light depend on domain orientation. Visualization of magnetic domains was performed by detecting cross polarized component of transmitted light. SNOM allows to obtain high resolution magnetic domain image and prevent sample from any disturbance by magnetic probe. Same area SNOM and MFM images are presented.