High-precision investigation of nanorod and nanosphere topological structures for nanoelectronic issues by means of atomic-force microscopy

3rd International School and Conference on Optoelectronics, Photonics, Engineering and Nanostructures (Saint Petersburg OPEN 2016)

Zhukov, M.V.^1,2 ; Lysak, V.V.^1 ; Mukhin, I.S.^1,3 ; Golubok, A.O.^1,2

Department of Material Science and Nanotechnology, ITMO University, 49, Kronverkskiy pr., Saint-Petersburg

197101, Russia^1

Department of Scanning Probe Microscopy and Spectroscopy, Institute for Analytical Instrumentation RAS, 31-33, Saint-Petersburg, Ivan Chernykh

198095, Russia^2

Laboratory of Renewable Energy Source, St Petersburg Academic University RAS, Khlopina, 8/3, Saint-Petersburg

194021, Russia^3

关键词: Adhesion forces;    Contact modes;    Contrast of Image;    High-precision;    Roughness analysis;    Topological structure;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/741/1/012003/pdf
DOI  :  10.1088/1742-6596/741/1/012003

来源: IOP

【 摘 要 】

Fabrication and study of specialized single nanowhisker probes are performed for high-precision investigation of elements such as nanospheres and nanorods using the atomic force microscopy. It was found that single nanowhisker probe significantly increases the resolution and contrast of images obtained in the semi-contact mode. Furthermore, the roughness analysis and adhesion forces are investigated in contact mode to comprehensively characterize properties of nanospherical and nanorod electronic structures.