会议论文详细信息
16th International Conference on X-ray Absorption Fine Structure
XAFS at the new materials science beamline 10 at the DELTA storage ring
Lützenkirchen-Hecht, D.^1 ; Wagner, R.^1 ; Frahm, R.^1
Bergische Universität Wuppertal, Gaußstr. 20, Wuppertal
42097, Germany^1
关键词: Beam lines;    EXAFS data;    Grazing incidence;    Hard X ray;    Photon energy;    Reference compounds;    Sample System;    Spectral range;   
Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/712/1/012026/pdf
DOI  :  10.1088/1742-6596/712/1/012026
来源: IOP
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【 摘 要 】

The layout and the characteristics of the hard X-ray beamline BL 10 at the superconducting asymmetric wiggler at the 1.5 GeV Dortmund Electron Accelerator DELTA are described. Equipped with a stable and robust Si(111) channel-cut monochromator, this beamline is suited for XAFS studies in the spectral range from about 4 keV to ca. 16 keV photon energy. We will illustrate the performance of the beamline, and present EXAFS data obtained from several reference compounds. XANES data measured for dilute sample systems as well as surface sensitive grazing incidence EXAFS obtained from thin film samples will also be discussed.

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