Development and tests of a new prototype detector for the XAFS beamline at Elettra Synchrotron in Trieste

6th Young Researcher Meeting, L'Aquila 2015

Fabiani, S.^1 ; Ahangarianabhari, M.^2 ; Baldazzi, G.^3 ; Bellutti, P.^4 ; Bertuccio, G.^2,5 ; Bruschi, M.^6 ; Bufon, J.^1,7,8 ; Carrato, S.^8 ; Castoldi, A.^5,9 ; Cautero, G.^1,7 ; Ciano, S.^1 ; Cicuttin, A.^10 ; Crespo, M.L.^10 ; Santos, M. Dos^10 ; Gandola, M.^2 ; Giacomini, G.^4 ; Giuressi, D.^7 ; Guazzoni, C.^5,9 ; Menk, R.H.^1,7 ; Niemela, J.^10 ; Olivi, L.^1,7 ; Picciotto, A.^4 ; Piemonte, C.^4 ; Rashevskaya, I.^11 ; Rachevski, A.^1 ; Rignanese, L.P.^3 ; Sbrizzi, A.^6 ; Schillani, S.^7 ; Vacchi, A.^1,12 ; Garcia, V. Villaverde^10 ; Zampa, G.^1 ; Zampa, N.^1 ; Zorzi, N.^4

Istituto Nazionale di Fisica Nucleare, Section of Trieste, Padriciano 99, Trieste

I-34149, Italy^1

Politecnico di Milano, Via Anzani 42, Como

I-22100, Italy^2

Universitá di Bologna, Via Zamboni 33, Bologna

I-40126, Italy^3

Fondazione Bruno Kessler - FBK, via Sommarive 18, Trento

I-38123, Italy^4

INFN Milano, Via Celoria 16, Milano

I-20133, Italy^5

INFN Sezione di Bologna, Via Irnerio 46, Bologna

I-40126, Italy^6

Elettra-Sincrotrone Trieste S.C.p.A., SS14, Trieste

I-34012, Italy^7

Universitá di Trieste, Piazzale Europa 1, Trieste

I-34128, Italy^8

Politecnico di Milano, Piazza Leonardo da Vinci 32, Milano

I-20133, Italy

(10) International Centre for Theoretical Physics - MLAB, Via Beirut 31, Trieste

I-34014, Italy

(11) TIFPA-INFN, via Sommarive 14, Trento

I-38123, Italy

(12) Universitá di Udine, Via delle Scienze 206, Udine

I-33100, Italy^9

关键词: Double reflections;    Energy resolutions;    Fluorescence measurements;    Prototype detector;    Short dead time;    Silicon Drift Detector;    Structural information;    Transmission measurements;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/689/1/012017/pdf
DOI  :  10.1088/1742-6596/689/1/012017

来源: IOP

【 摘 要 】

The XAFS beamline at Elettra Synchrotron in Trieste combines X-ray absorption spectroscopy and X-ray diffraction to provide chemically specific structural information of materials. It operates in the energy range 2.4-27 keV by using a silicon double reflection Bragg monochromator. The fluorescence measurement is performed in place of the absorption spectroscopy when the sample transparency is too low for transmission measurements or the element to study is too diluted in the sample. We report on the development and on the preliminary tests of a new prototype detector based on Silicon Drift Detectors technology and the SIRIO ultra low noise front-end ASIC. The new system will be able to reduce drastically the time needed to perform fluorescence measurements, while keeping a short dead time and maintaining an adequate energy resolution to perform spectroscopy. The custom-made silicon sensor and the electronics are designed specifically for the beamline requirements.