Probe beam-free detection of terahertz wave by electroluminescence induced by intense THz pulse

8th International Conference on Inertial Fusion Sciences and Applications

Shin, J.^1 ; Jin, Z.^2 ; Nosaka, Y.^1 ; Nakazawa, T.^1 ; Kodama, R.^1,2,3

Graduate School of Engineering, Osaka University, 2-1, Yamadaoka, Osaka Suita

565-0871, Japan^1

Photon Pioneers Center, Osaka University, 2-1, Yamadaoka, Osaka Suita

565-0871, Japan^2

Institute of Laser Engineering, Osaka University, 2-6 Yamadaoka, Osaka Suita

565-0871, Japan^3

关键词: Field detections;    Low costs;    Probe beam;    Terahertz pulse;    THz detection;    THz fields;    THz pulse;    Two-color laser;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/688/1/012108/pdf
DOI  :  10.1088/1742-6596/688/1/012108

来源: IOP

【 摘 要 】

Recently, a table-top fs laser system can generate MW terahertz (THz) pulse with its electric field higher than 100 kV/cm can be generated by several schemes. Such a strong THz field can directly drive electrons inside various materials. Here, we demonstrated a direct THz electric field detection method by measuring the electroluminescence induced by intense THz pulse inside commonly available light emitting diode. An intense THz wave obtained by the two-color laser scheme was focused onto LED along with an external DC bias to induce luminescence which we found proportional to the amplitude of the incident THz field. The scheme can be useful to realize a low-cost, probe-free THz detection and imaging system.