Diffraction pattern by nanometric thin films under illumination of an orbital angular momentum beam with integer topological charge

3rd International Meeting for Researchers in Materials and Plasma Technology; 1st Symposium on Nanoscience and Nanotechnology

物理学;材料科学

Mendoza, J.H.^1 ; Díaz, C.F.^1 ; Acevedo, C.H.^1 ; Torres, Y.^1

Universidad Industrial de Santander, Bucaramanga, Colombia^1

关键词: Eigenstates;    Engineering applications;    Integer values;    Nanometric thin films;    Orbital angular momentum;    Orbital angular momentum of light;    Titanium-based;    Topological charges;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/687/1/012026/pdf
DOI  :  10.1088/1742-6596/687/1/012026

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

The orbital angular momentum of light has a big contribution in many engineering applications like optical communications, because this physical property allows eigenstates characteristic of the wavefront rotation when the beam is propagated. The nature of these eigenstates allows that information can be encoded and gives immunity to electromagnetic interference, allowing an increase of bandwidth, cadence and capacity of the communication channel. This work shown the methodology using nanometric thin films like Titanium based (TiO2) grown over strontium titanate (SrTiO3) support, to distinguish and discriminate a well- defined integer value of the topological charge of an OAM beam.