Far field imaging of a dielectric inclusion

5th International Workshop on New Computational Methods for Inverse Problems

物理学;计算机科学

Wahab, Abdul^1 ; Ahmed, Naveed^2 ; Abbas, Tasawar^3

Department of Mathematics, COMSATS Institute of Information Technology, Wah Cantt.

47040, Pakistan^1

Weierstrass Institute for Applied Analysis and Stochastics, Leibniz Institute in Forschungsverbund Berlin E. V. (WIAS), Mohrenstr. 39, Berlin

10117, Germany^2

Department of Mathematics and Statistics, FBAS, International Islamic University, Islamabad

44000, Pakistan^3

关键词: Dielectric inclusions;    Far field;    Far-field imaging;    Far-field scattering;    Fixed frequency;    Multiple measurements;    Non-iterative;    Topological sensitivity;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/657/1/012001/pdf
DOI  :  10.1088/1742-6596/657/1/012001

学科分类：计算机科学（综合）

来源: IOP

【 摘 要 】

A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.