会议论文详细信息
5th International Workshop on New Computational Methods for Inverse Problems | |
Far field imaging of a dielectric inclusion | |
物理学;计算机科学 | |
Wahab, Abdul^1 ; Ahmed, Naveed^2 ; Abbas, Tasawar^3 | |
Department of Mathematics, COMSATS Institute of Information Technology, Wah Cantt. | |
47040, Pakistan^1 | |
Weierstrass Institute for Applied Analysis and Stochastics, Leibniz Institute in Forschungsverbund Berlin E. V. (WIAS), Mohrenstr. 39, Berlin | |
10117, Germany^2 | |
Department of Mathematics and Statistics, FBAS, International Islamic University, Islamabad | |
44000, Pakistan^3 | |
关键词: Dielectric inclusions; Far field; Far-field imaging; Far-field scattering; Fixed frequency; Multiple measurements; Non-iterative; Topological sensitivity; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/657/1/012001/pdf DOI : 10.1088/1742-6596/657/1/012001 |
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学科分类:计算机科学(综合) | |
来源: IOP | |
【 摘 要 】
A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.
【 预 览 】
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