Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy

Electron Microscopy and Analysis Group Conference 2015

S'Ari, M.^1 ; Cattle, J.^1 ; Hondow, N.^1 ; Blade, H.^2 ; Cosgrove, S.^2 ; Brydson, R.M.^1 ; Brown, A.P.^1

Institute for Materials Research, School of Chemical and Process Engineering, University of Leeds, Leeds

LS2 9JT, United Kingdom^1

Pharmaceutical Development, AstraZeneca, Macclesfield

SK10 2NA, United Kingdom^2

关键词: Chemical moieties;    Chemical space;    Electron beam damage;    Electron dosage;    Low dose;    Pharmaceutical compounds;    Pharmaceutical materials;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/644/1/012038/pdf
DOI  :  10.1088/1742-6596/644/1/012038

来源: IOP

【 摘 要 】

We have studied the impact of transmission electron microscopy (TEM) and low dose electron diffraction on ten different crystalline pharmaceutical compounds, covering a diverse chemical space and with differing physical properties. The aim was to establish if particular chemical moieties were more susceptible to damage within the electron beam. We have measured crystalline diffraction patterns for each and indexed nine out of ten of them. Characteristic electron dosages are reported for each material, with no apparent correlation between chemical structure and stability within the electron beam. Such low dose electron diffraction protocols are suitable for the study of pharmaceutical compounds.