会议论文详细信息
29th International Conference on Photonic, Electronic, and Atomic Collisions | |
Line Profile Property of Autoionizing States | |
Tu, B.^1 ; Xiao, J.^1 ; Yao, K.^1 ; Shen, Y.^1 ; Yang, Y.^1 ; Lu, D.^1 ; Fu, Y.Q.^1 ; Wei, B.^1 ; Zheng, C.^1 ; Huang, L.Y.^1 ; Hutton, R.^1 ; Zou, Y.^1 | |
Shanghai EBIT Laboratory, Institute of Modern Physics, Fudan University, Key Laboratory of Applied Ion Beam Physics, Chinese Ministry of Education, China^1 | |
关键词: Autoionizing state; Dielectronic recombinations; Interference effects; Line profiles; Lorentzian line; Radiative recombination; Tungsten ions; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/635/5/052037/pdf DOI : 10.1088/1742-6596/635/5/052037 |
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来源: IOP | |
【 摘 要 】
This work studied the interference effect between dielectronic recombination and radiative recombination of highly charged tungsten ions. Our result shows a coexistence of Fano and Lorentzian line profile of autoionizing states.
【 预 览 】
Files | Size | Format | View |
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Line Profile Property of Autoionizing States | 155KB | download |