Ion extraction from a compact electron beam ion trap

29th International Conference on Photonic, Electronic, and Atomic Collisions

Nakajima, Takayuki^1 ; Kanehara, Tatsuhiko^1 ; Yanaka, Yuki^1 ; Yatsurugi, Junji^1 ; Nakamura, Nobuyuki^1

Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo

182-8585, Japan^1

关键词: Charge state;    Charged ions;    Electron beam ion traps;    Ion extraction;    Spectroscopic studies;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/4/042007/pdf
DOI  :  10.1088/1742-6596/635/4/042007

来源: IOP

【 摘 要 】

An ion extraction system has been installed at the compact electron beam ion trap CoBIT, which is a useful device for the spectroscopic studies of moderately charged ions. The extracted ions are used for definite charge state determination of the trapped ions observed in the spectroscopic studies.