Linear polarization of x rays due to dielectronic recombination into highly charged ions

29th International Conference on Photonic, Electronic, and Atomic Collisions

Shah, Chintan^1 ; Jörg, Holger^1 ; Hu, Zhimin^1 ; Bernitt, Sven^2 ; Bekker, Hendrik^2 ; Blessenohl, Michael A.^2 ; Hollain, Daniel^2 ; Weber, Sebastian^1 ; Dobrodey, Stepan^2 ; Fritzsche, Stephan^3 ; Surzhykov, Andrey^4 ; López-Urrutia, José R Crespó^2 ; Tashenov, Stanislav^1

Physikalisches Institut, Universitat Heidelberg, Heidelberg

69120, Germany^1

Max-Planck-Institut für Kernphysik, Heidelberg

69117, Germany^2

Friedrich-Schiller-Universitat Jena, Jena

07743, Germany^3

Helmholtz-Institut, Jena

07743, Germany^4

关键词: Breit interaction;    Compton polarimeters;    Dielectronic recombinations;    Electron beam ion traps;    High sensitivity;    Highly charged ions;    Linear polarization;    X-ray polarizations;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/5/052091/pdf
DOI  :  10.1088/1742-6596/635/5/052091

来源: IOP

【 摘 要 】

The linear polarization of x rays produced by dielectronic recombination into highly charged ions was for the first time measured at an electron beam ion trap using a newly developed Compton polarimeter. The experimental results open a possibility for diagnostics of anisotropies of hot plasmas. We also demonstrate a high sensitivity of the x-ray polarization to the Breit interaction.