Miniature nanoparticle sensors for exposure measurement and TEM sampling

4th International Conference on Safe Production and Use of Nanomaterials

Fierz, Martin^1,2 ; Meier, Dominik^1 ; Steigmeier, Peter^2 ; Burtscher, Heinz^2

Naneos Particle Solutions LLC, Dorfstr. 69, Windisch

CH-5210, Switzerland^1

University of Applied Sciences Northwestern Switzerland, Klosterzelgstr. 2, Windisch

CH-5210, Switzerland^2

关键词: Comprehensive risks;    Exposure measurement;    Personal exposures;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/617/1/012034/pdf
DOI  :  10.1088/1742-6596/617/1/012034

来源: IOP

【 摘 要 】

Nanoparticles in workplaces may pose a threat to the health of the workers involved. With the general boom in nanotechnology, an increasing number of workers is potentially exposed, and therefore a comprehensive risk management with respect to nanoparticles appears necessary. One (of many) components of such a risk management is the measurement of personal exposure. Traditional nanoparticle detectors are often cumbersome to use, large, heavy and expensive. We have developed small, reliable and easy to use devices that can be used for routine personal exposure measurement in workplaces.