会议论文详细信息
| 2014 Joint IMEKO TC1-TC7-TC13 Symposium: Measurement Science Behind Safety and Security | |
| Changes in a basic course of electrical measurement caused by development in microelectronics | |
| Haasz, V.^1 | |
| Czech Technical University in Prague, Fac. of Electrical Eng., Department of Measurement, Technicka 2, Prague | |
| 166 27, Czech Republic^1 | |
| 关键词: Analogue signal processing; Basic course; Electrical measurement; Measuring instruments; Technical universities; | |
| Others : https://iopscience.iop.org/article/10.1088/1742-6596/588/1/012010/pdf DOI : 10.1088/1742-6596/588/1/012010 |
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| 来源: IOP | |
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【 摘 要 】
Changes in electrical measurement and instrumentation caused by a development in microelectronics should be reflected also in education. This trend runs more than 50 years. At present it relates especially to substitution of analogue signal processing by digital processing of sampled signal in a number of measuring instruments. The actual essential changes in the basic course of electrical measurement at the Faculty of Electrical Engineering of the Czech Technical University (CTU) in Prague corresponding to this progress in last years are presented.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| Changes in a basic course of electrical measurement caused by development in microelectronics | 631KB |
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