An impact of multiple wave reflections in a flat sample on material parameter reconstruction using THz pulsed spectroscopy

International Scientific Seminars on "Fundamental and Applied Problems of Photonics and Condensed Matter Physics"

Zaytsev, Kirill I.^1 ; Tsapenko, Konstantin P.^1 ; Nosov, Pavel A.^1 ; Yurchenko, Stanislav O.^1

Bauman Moscow State Technical University, 2nd Baumanskaya str. 5, Moscow

105005, Russia^1

关键词: Fabry-Perot resonators;    Local linearization;    Material parameter;    Multiple reflections;    Multiple waves;    Pulsed spectroscopy;    Terahertz;    Wave forms;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/584/1/012005/pdf
DOI  :  10.1088/1742-6596/584/1/012005

来源: IOP

【 摘 要 】

The present paper is dedicated to studying the accuracy of sample material parameter reconstruction using terahertz (THz) pulsed spectroscopy. The technique for characterizing the material parameters of thin flat samples allowing to take into account multiple wave reflections in a flat have been considered. While transmitting through the resonant sample, THz pulse undergoes multiple reflections, which result in satellite pulses in THz waveform. The accuracy of material parameter reconstruction strongly depends on the number of satellite pulses. We have analytically estimated an impact of satellite pulses on material parameter reconstruction by considering the local linearization of theoretical sample transfer function based on the model of quasi-Fabry-Perot-resonator.