A Comparison of Terahertz Pulsed Spectroscopy and Backward-Wave Oscillator Spectroscopy

1st International Scientific School on Methods of Digital Image Processing in Optics and Photonics

物理学;计算机科学

Zaytsev, Kirill I.^1 ; Gavdush, Arseniy A.^1 ; Chernomyrdin, Nikita V.^1 ; Kruchkov, Nikita P.^1 ; Kudrin, Konstantin G.^1,2 ; Nosov, Pavel A.^1 ; Karasik, Valeriy E.^1 ; Yurchenko, Stanislav O.^1

Bauman Moscow State Technical University, 2nd Baumanskaya str. 5/1, Moscow

105005, Russia^1

P.A.Hertzen Moscow Research Institute of Oncology, 2nd Botkinsky proezd 3, Moscow

125284, Russia^2

关键词: Backward wave oscillator;    Backward-wave oscillators;    Low refractive index;    Material parameter;    Multiple reflections;    Pulsed spectroscopy;    Reconstruction accuracy;    Terahertz pulsed spectroscopy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/536/1/012009/pdf
DOI  :  10.1088/1742-6596/536/1/012009

学科分类：计算机科学（综合）

来源: IOP

【 摘 要 】

This paper presents new experimental and theoretical results for the material parameter reconstruction utilizing the terahertz (THz) pulsed spectroscopy (TPS). The material parameter reconstruction algorithm was realized and experimentally implemented to study the test sample. The algorithm takes into account multiple reflections of THz pulse within the flat sample during the transmission mode measurements. Therefore the samples with small thickness or low refractive index could be studied utilizing the proposed method. In order to estimate the reconstruction accuracy, test sample material parameters, obtained with the TPS, were compared with the results of the same sample studying by the use of the backward-wave oscillator (BWO) spectroscopy. Thus, high reconstruction accuracy was demonstrated.