Photoluminescence Emission and Structure Diversity in ZnO:Ag Nanorods

7th International Congress of Engineering Physics

物理学;工业技术

Velázquez Lozada, E.^1 ; Camacho González, G.M.^2 ; Torchynska, T.^3

SEPI-ESIME-Instituto Politécnico Nacional, México D. F.

07738, Mexico^1

ESIME-Instituto Politécnico Nacional, México D. F.

07738, Mexico^2

ESFM-Instituto Politécnico Nacional, México D. F.

07738, Mexico^3

关键词: Defect-related emission;    Near band edge emissions;    Photoluminescence emission;    Scanning electronic microscopy (SEM);    Second order diffraction;    Structural characteristics;    Temperature dependence;    Ultrasonic spray pyrolysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/582/1/012031/pdf
DOI  :  10.1088/1742-6596/582/1/012031

学科分类：工业工程学

来源: IOP

【 摘 要 】

The photoluminescence, its temperature dependences, as well as structural characteristics by methods of Scanning electronic microscopy (SEM) have been studied in ZnO:Ag nanorods prepared by the ultrasonic spray pyrolysis (USP). The PL spectra of the ZnO:Ag NRs over the temperature range from 10 K to 300 K are investigated. Three types of PL bands have been revealed: i) the near-band-edge (NBE) emissions, ii) defect related emission and iii) IR emissions. It is shown the IR emission corresponds to the second-order diffraction of the near-band-edge (NBE) emission bands. The study of NBE PL temperature dependences reveals that the acceptor bound exciton (ABE) and its second-order diffraction peak disappeared at the temperature higher than 200 K. The attenuation of the ABE peak intensity is ascribed to the thermal dissociation of ABE with appearing of a free exciton (FE). The PL bands, related to the LO phonon replica of FE and its second-order diffraction, dominate in the PL spectra at room temperature that testify on the high quality of the ZnO:Ag films prepared by the USP technology.